 | ||
Multi-layered graphene sample | ||
 | Graphene monolayer, bilayer and other multiple-layer regions identified StreamLine™ Plus image showing the distribution of different thicknesses within a graphene flake Map area: 110 µm x 120 µm Spectra generated: 40,000 Acquisition time: 14 minutes | |
CVD diamond film | ||
 | Polished surface of polycrystalline diamond film grown by CVD technique Images show information on crystal shape, orientation, stresses and defect densities Map area: 175 µm x 88 µm Spectra generated: 51,200 Acquisition time: 2 imaging experiments, 15 minutes each (first acquisition used to generate three Raman images, second acquisition used to generate photoluminescence image) Image 1: Raman image showing 1 cm-1 variation in position of the 1332 cm-1 diamond band Image 2: Raman image showing 2 cm-1 variation in width of the 1332 cm-1 diamond band Image 3: Raman image showing variation in peak area of the 1332 cm-1 diamond band Image 4: Photoluminescence image showing variation in the intensity of the 1.68 eV neutral silicon vacancy [Si-V]0 band | |
Micro indentation in silicon wafer | ||
 | Peak position Peak position derived from curve-fit analysis Map area: 10 µm x 10 µm Spectra generated: 10,000 Acquisition time: 36 minutes (single acquisition analysed for both images) Scan details: 100 nm step achieved using piezoelectic scanning stage | |
 | Peak width Peak width derived from curve-fit analysis | |
Sandstone from Loch Torridon, Scotland | ||
 | StreamLine™ Plus image showing the distribution of Anatase (TiO2) (red), Quartz (SiO2) (green) and Haematite (Fe2O3) (blue) Area of section: 500 µm x 320 µm Spectra generated: 67,200 Acquisition time: 20 minutes | |
Polymer laminate (PS and PMMA) | ||
 | StreamLine™ Plus image of polymer laminate sample showing the distribution of PMMA (red), Epoxy (green) and PS (blue) Map area: 240 µm x 645 µm Spectra generated: 17,200 Acquisition time: 7 minutes | |
Strained S-Ge cross-hatch | ||
 | StreamLine™ Plus image of a Si-Ge semiconductor sample exhibiting a strained structure. The map shows variation in the Si-Si 510 cm-1 bａnd position (~0.2 cm-1 positional bａnd shift). The map data was generated using curve fitting. Map area: 129µm x 130µm Spectra generated: 55,000 Acquisition time: 13 minutes | |
Tooth section | ||
 | StreamLine™ Plus image of a sectioned tooth, highlighting the enamel (green), dentine (blue) and areas of high fluorescence (red) Map area: 9mm x 16mm Spectra generated: 84,000 Acquisition time: 20 minutes | |
| Multilayred graphene sample | ||
Laser induced crystalline silicon tracks | ||
 | StreamLine™ Plus image of laser induced crystalline silicon tracks on amorphous substrate Map area: 550µm x 550µm Spectra generated: 70,000 Acquisition time: 17 minutes | |
 | Zoomed region (~ 250µm x 250µm) of above image | |
浙江精科計量儀器有限公司是一家專業從事計量器具、儀器儀表、檢測設備的銷售、維修、計量于一體的商貿公司。主要產品有三坐標、光譜儀、齒輪測量中心、激光干涉儀、柔性測量臂、激光跟蹤儀、無損探傷檢測、圓度儀圓柱度儀、輪廓儀、粗糙度儀、材料試驗、金相系統、環境試驗等精密量儀，應用于工業制造，院校教學，質量監督，科技科研等相關領域。 精科公司自成立以來，先后在浙江區域的臺州、杭州、寧波、永康、溫州設立了分公司及辦事處，為客戶滿意而服務。精科公司站在用戶角度以企業的“節約成本，提高質量，科學管理”為導向，擔負著各行業“質量求發展”的使命，始終秉承“誠信為根，服務為本”的經營理念，在用戶朋友及協作單位中有良好的信譽，在行業內較有影響力。現已成為計量檢測儀器行業的熟知品牌。精科公司正迅猛發展，繼續本著“精益求精，全心全意”的服務精神，為中國工業發展和品牌提升，做出更大的貢獻。
三維掃描儀
拉曼光譜儀 產品信息
