国产精自产拍久久久久久蜜,亚洲视频在线观看,亚洲小说图片,国产伦精品一区二区三区免.费

行業(yè)產(chǎn)品

  • 行業(yè)產(chǎn)品

賽默飛世爾科技(中國)有限公司


當前位置:賽默飛世爾科技(中國)有限公司>>電子顯微鏡>>組合聚焦離子束 - 掃描電子顯微鏡>>Helios 6 HD Focused Ion Beam Scanning Electron Microscope

Helios 6 HD Focused Ion Beam Scanning Electron Microscope

返回列表頁
參  考  價面議
具體成交價以合同協(xié)議為準

產(chǎn)品型號Thermo Scientific

品       牌

廠商性質(zhì)其他

所  在  地

聯(lián)系方式:查看聯(lián)系方式

更新時間:2023-11-06 22:36:08瀏覽次數(shù):350次

聯(lián)系我時,請告知來自 環(huán)保在線

產(chǎn)品簡介

The Thermo Scientific Helios 6 HD FIB-SEM is designed to meet the industry need for higher volumes of high-quality TEM data for failure analysis and metrology. This latest addition to the Thermo Scie......

詳細介紹

Helios 6 HD FIB-SEM benefits

FIB-SEM availability 

Optimal utilization is required to minimize operating costs. The Helios 6 HD FIB-SEM maximizes system utilization with its new Osprey FIB column, featuring automated source and column alignments that reduces the need for operator and service technician intervention. Additionally, the new Thermo Scientific EasyLift NanoManipulator streamlines the needle change procedure and minimizes costly production interruptions. 

TEM sample preparation throughput 

The Helios 6 HD FIB-SEM features Thermo Scientific AutoTEM 6 Software, which performs automated alignments and enhances grid management for faster setup. An all-new digital scan engine allows simultaneous SEM imaging and milling while also providing precise scan rotation and accurate pattern positioning. This combination of hardware and software innovations provides a greater than 15% increase in the number of site-specific samples per hour compared with existing systems. 

TEM sample quality 

Sample success rate and quality are of paramount importance, regardless of the type of sample or the sample complexity. Failure analysis labs are expected to deliver high-quality TEM data from every metrology or defect analysis sample. 

The Helios 6 HD FIB-SEM contains a new digital scan engine and FIB-SEM control architecture, which provides manual or semi-automated end-pointing for precise isolation of the feature of interest within the sample. In addition, the new Osprey FIB column provides improved low-kV milling. These features combine to deliver high-quality TEM samples, to help you answer the most challenging analysis questions. 

Learn more about semiconductor TEM imaging and analysis › 


感興趣的產(chǎn)品PRODUCTS YOU ARE INTERESTED IN

環(huán)保在線 設計制作,未經(jīng)允許翻錄必究 .? ? ? Copyright(C)?2021 http://www.aboay.com,All rights reserved.

以上信息由企業(yè)自行提供,信息內(nèi)容的真實性、準確性和合法性由相關企業(yè)負責,環(huán)保在線對此不承擔任何保證責任。 溫馨提示:為規(guī)避購買風險,建議您在購買產(chǎn)品前務必確認供應商資質(zhì)及產(chǎn)品質(zhì)量。

會員登錄

×

請輸入賬號

請輸入密碼

=

請輸驗證碼

收藏該商鋪

登錄 后再收藏

提示

您的留言已提交成功!我們將在第一時間回復您~
主站蜘蛛池模板: 阿瓦提县| 安乡县| 芜湖市| 怀集县| 巴彦淖尔市| 观塘区| 双牌县| 宣恩县| 衡阳市| 沧源| 石林| 茶陵县| 黑龙江省| 通辽市| 浮山县| 扶绥县| 建湖县| 山丹县| 垣曲县| 潜山县| 隆昌县| 凤凰县| 武功县| 康定县| 汕头市| 甘肃省| 华亭县| 彭泽县| 馆陶县| 卫辉市| 吴忠市| 赤壁市| 萝北县| 姜堰市| 高要市| 金华市| 黄龙县| 肥东县| 光泽县| 金沙县| 沂源县|